News
Wafer Level Void-Free Molded Underfill For High-Density Fan-out Packages - Semiconductor Engineering
In this study, experiments and mold flow simulation results are presented for a void-free wafer level molded underfill (WLMUF) process with High-Density Fan-Out (HDFO) test vehicles using a ...
Two underfill voids, one void above the underfill (white area) and the other void below the underfill (black area), appear in this 300-MHz image. The image shows several questionable ILD features—the ...
In addition to the area array parameters, the voiding in the flip-chip underfill is of great importance, particularly to its reliability during the reflow process.
Underfill: An encapsulant material, typically epoxy-based, that is used to fill the gap between the chip and substrate to improve mechanical stability and distribute thermal stresses.
Features of One Component Epoxy Underfill Compounds. The new Master Bond line of epoxy underfills contains low viscosity, highly flowable compounds that produce uniform void-free epoxy layers for ...
Neither of the failures observed for Grade 0 packages in 175°C were present at 150°C with no underfill cracking or solder voiding being detected [2]. This suggests that the 1000-hour exposure at 175°C ...
The ASYMTEK Vantage® Dispensing system equipped with IntelliJet® Jetting system reduced underfill voids and decreased cycle time by almost 30%.; CARLSBAD, Calif.--(BUSINESS WIRE)-- Nordson ...
High-material module underfill has an extremely low CTE, for instance Underfill-A CTE = 63 ppm/°C. The normal CTE data for this type of underfill material are 63, 70, and 75 ppm/°C. High-material ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results