TOKYO, Dec. 09, 2024 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced an integrated test cell designed to maximize die-level test ...
TOKYO, Dec. 16, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) (“Advantest”) and Tokyo Seimitsu Co., Ltd. (TSE: 7729) (“Tokyo Seimitsu”) ...
"I'm excited about our ongoing partnership with leaders in semiconductor test to develop cutting-edge probe cleaning materials that address emerging needs, enhance efficiency, and optimize wafer yield ...
STAr Technologies, a leading manufacturer of semiconductor test probe cards, unveiled the new 3D/2.5D MEMS micro-cantilever probe card for WAT reliability testing. The Virgo-Prima Series probe card is ...
The types of devices being deployed in cars and how they differ in functionality. Why each device type requires a different test technique. Determining the best approach for the specific application.
Semiconductor probe card makers like Chunghwa Precision Test Tech (CHPT) are cautiously bullish about 2024's market prospects, counting on demand for HPC chips, application processors (AP), and ...
Test facilities are beginning to implement real-time maintenance, rather than scheduled maintenance, to reduce manufacturing costs and boost product yield. Adaptive cleaning of probe needles and test ...
NI (Nasdaq: NATI), the provider of solutions that enable engineers and scientists to solve the world’s greatest engineering challenges, announced the NI Semiconductor Test System (STS) series. These ...
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Robotic probe quickly measures semiconductor properties to accelerate solar panel development
Scientists are striving to discover new semiconductor materials that could boost the efficiency of solar cells and other electronics. But the pace of innovation is bottlenecked by the speed at which ...
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