ABERDEEN PROVING GROUND, MD – In October 2023, the U.S. Army Test and Evaluation Command (ATEC) demonstrated a Multi-Domain Operations Distributed Live, Virtual, Constructive (LVC) Initial Operational ...
A new publication from Opto-Electronic Advances, 10.29026/oes.2024.240001 discusses robust detection technology of orbital angular momentum of partially coherent vortex light fields in complex ...
System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...
As chips become more heterogeneous with more integrated functionality, testing them presents increasing challenges — particularly for high-speed system-on-chip (SoC) designs with limited test pin ...
In the fast-paced world of technology, where innovation and efficiency are paramount, integrating artificial intelligence (AI) and machine learning (ML) into the semiconductor testing ecosystem has ...
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