SANTA CLARA, Calif.--(BUSINESS WIRE)--What’s New: Intel, Bluefors* and Afore* have introduced the first cryoprober, a quantum testing device named the Cryogenic Wafer Prober, developed specifically to ...
SAN JOSE, Calif. — Electroglas Inc. has rolled out the EG6000e — a fully-automatic, 300-mm parametric wafer prober said to be designed for high-throughput, low-noise measurements. The EG6000e ...
A technical paper titled “Probing single electrons across 300-mm spin qubit wafers” was published by researchers at Intel Corporation. “Building a fault-tolerant quantum computer will require vast ...
We have successfully developed, for the first time, a new memory test system for STT-MRAM at wafer-level where an electromagnet is combined with a memory test system and a 300 mm wafer prober. In the ...
Based on FormFactor's scalable MicroSpring interconnect technology, the PH150 probe card enables the testing of 300-mm DRAM wafers in just six touchdowns. The ability to test a wafer in fewer ...
FormFactor has introduced the PH150XP wafer probe card, an extension of the company's PH150 product family for DRAM wafer testing. The PH150XP offers several yield and throughput enhancements to ...
I’ve had a fairly varied early part of my career in the semiconductors business: a series of events caused me to jump disciplines a little bit, and after one such event, I landed in the test ...
HSINCHU, July 29, 2022 /PRNewswire/ -- MPI Corporation's Advanced Semiconductor Test Division, an industry and innovation leader of semiconductor test solutions initiated the integration of the TS3500 ...
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